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Back to Home » July 2011 News » Nova Pushing the Limits of 3D Profile Metrology With New Optical CD System |
Nova Pushing the Limits of 3D Profile Metrology With New Optical CD System |
July 11, 2011
REHOVOT, Israel, July 11, 2011 /PRNewswire/ --
Innovative and unique optical configuration enables the move
to vertical devices in next-generation memory and microprocessor
chips
Built to Nova industry-leading stability and reliability
standards
Extends range of Nova's market leading high
Source URL: http://www.prnewswire.com/news-releases/nova-pushing-the-limits-of-3d-profile-metrology-with-new-optical-cd-system-125336538.html
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